Tech Obsolescence

Speaking Of Reliability: Friends Discussing Reliability Engineering Topics | Warranty | Plant Maintenance

Tech Obsolescence

Abstract

Kirk and Fred discuss long-term reliability and the speed of technological obsolescence.

Key Points

Join Kirk and Fred as they discuss the rapid pace of technological obsolescence and the need to upgrade devices before they wear out
Topics include:

• One of the most successful computer manufacturers controls both the software operating system (OS) and the hardware and will make a new upgrade that is incompatible with older hardware obsolete even though there is potentially many years of life in the older hardware.
• Many simple products, like Fred’s drill press, have lasted decades and have few technological advances that would cause him to replace it when it is still able to do the job.
• Some household appliances, such as today’s washers and dryers, have significant life despite the high vibration and temperature cycles and the considerable variation in the use environment, and yet the advantages of lower water and energy use in newer models may be a reason to upgrade machines.

Enjoy an episode of Speaking of Reliability. Where you can join friends as they discuss reliability topics. Join us as we discuss topics ranging from design for reliability techniques to field data analysis approaches.

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Show Notes

Please click on this link to access a relatively new analysis of traditional reliability prediction methods article from the US ARMY and CALCE titled “Reliability Prediction – Continued Reliance on a Misleading Approach”. It is in the public domain, so please distribute freely. Trying to predict reliability for development is a misleading a costly approach.

You can now purchase the most recent recording of Kirk Gray’s Hobbs Engineering 8 (two 4 hour sessions) hour Webinar “Rapid and Robust Reliability Development 2022 HALT & HASS Methodologies Online Seminar” from this link.

For more information on the newest discovery testing methodology here is a link to the book “Next Generation HALT and HASS: Robust design of Electronics and Systems” written by Kirk Gray and John Paschkewitz.

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